Source: Journal of Synchrotron Radiation. Unidade: IF
Assunto: CRISTALOGRAFIA
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HAYASHI, M. A. et al. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001). Journal of Synchrotron Radiation, v. 6, p. 29-33, 1999Tradução . . Disponível em: https://doi.org/10.1107/s0909049598012953. Acesso em: 21 maio 2024.APA
Hayashi, M. A., Avanci, L. H., Cardoso, L. P., Carvalho, M. M. G. de, Morelhao, S. L., & Collins, S. P. (1999). High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001). Journal of Synchrotron Radiation, 6, 29-33. doi:10.1107/s0909049598012953NLM
Hayashi MA, Avanci LH, Cardoso LP, Carvalho MMG de, Morelhao SL, Collins SP. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001) [Internet]. Journal of Synchrotron Radiation. 1999 ; 6 29-33.[citado 2024 maio 21 ] Available from: https://doi.org/10.1107/s0909049598012953Vancouver
Hayashi MA, Avanci LH, Cardoso LP, Carvalho MMG de, Morelhao SL, Collins SP. High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001) [Internet]. Journal of Synchrotron Radiation. 1999 ; 6 29-33.[citado 2024 maio 21 ] Available from: https://doi.org/10.1107/s0909049598012953
